Microscopy with structured plane illumination and point accumulation for imaging and nanoscale topography
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United States of America Patent
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Oct 6, 2020
Grant Date -
Jul 7, 2016
app pub date -
Dec 7, 2015
filing date -
Dec 6, 2014
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Abstract
A sample is bathed in a solution that includes labels having a binding affinity for a structure on the sample and that emit light in response to excitation light. A sheet of excitation light having a FWHM thickness is provided to the sample. Light emitted from labels in response to the excitation light is imaged onto a detector, where the light is imaged with a detection objective having a depth of focus comparable to or greater than the FWHM thickness. The bathing of the sample and the imaging of the light emitted from the bound labels is controlled, such that the imaged light from different individual labels bound to the structure is resolved on the detector. The providing, imaging, and controlling are repeated to image, at different times, light from labels bound to the structure at different locations on or within the sample.
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