MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME

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United States of America Patent

APP PUB NO 20160190334A1
SERIAL NO

14582929

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Abstract

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Provided is a memory device including a substrate, a plurality of tunneling dielectric layers, a plurality of isolation structures, and a plurality of cap layers. The tunneling dielectric layers are located on the substrate. Each isolation structure has an upper portion and a lower portion. The lower portions of the isolation structures are located in the substrate and arranged alternately with the tunneling dielectric layers along a first direction. The upper portions of the isolation structures are located on the lower portions. The cap layers are located on the upper portions. A top surface of the cap layer is a planar surface.

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Patent Owner(s)

Patent OwnerAddress
MACRONIX INTERNATIONAL CO LTDNO 16 LI-HSIN RD SCIENCE-BASED INDUSTRIAL PARK HSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hsu, Han-Hui Hsinchu, TW 8 10
Lee, Hong-Ji Hsinchu, TW 38 279

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