NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTROMETRY

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United States of America Patent

SERIAL NO

15061680

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Abstract

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Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.

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Patent Owner(s)

Patent OwnerAddress
IONWERKS INC3401 LOUISIANA SUITE 355 HOUSTON TX 77002

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Egan, Thomas F Houston, US 51 928
Lewis, Ernest K Pearland, US 9 33
Schultz, J Albert Houston, US 38 845
Ulrich, Steven Houston, US 12 115
Waters, Kelley L Houston, US 12 69

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