Minute object characteristics measuring apparatus
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 2, 2018
Issued Date -
N/A
app pub date -
Dec 28, 2015
filing date -
Dec 26, 2014
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A minute object characteristics measuring apparatus is provided. The minute object characteristics measuring apparatus includes a holder, a cantilever, a measuring device, and a driver. The holder holds a minute object. The cantilever faces the minute object held by the holder. The measuring device measures a displacement of the cantilever. The driver drives one of the holder holding the minute object and the cantilever in a direction that the minute object held by the holder and the cantilever are brought close to or drawn away from each other.
First Claim
all claims..Other Claims data not available
Family
Country | kind | publication No. | Filing Date | Type | Sub-Type |
---|---|---|---|---|---|
JP | B2 | JP6766351 | Dec 11, 2015 | Patent | Grant |
Type : Patent Sub-Type : Grant | |||||
PUBLISHED GRANTED PATENT (SECOND LEVEL) | 微小物特性計測装置 | Oct 14, 2020 |
- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
RICOH COMPANY LTD | 3-6 NAKAMAGOME 1-CHOME OHTA-KU TOKYO |
International Classification(s)

- 2015 Application Filing Year
- G01H Class
- 267 Applications Filed
- 185 Patents Issued To-Date
- 69.29 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Someno, Shuusuke | Kanagawa, JP | 3 | 8 |
# of filed Patents : 3 Total Citations : 8 | |||
Yamaguchi, Daichi | Kanagawa, JP | 27 | 378 |
# of filed Patents : 27 Total Citations : 378 |
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- 0 Citation Count
- G01H Class
- 0 % this patent is cited more than
- 7 Age
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Fee | Large entity fee | small entity fee | micro entity fee | due date |
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7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Jul 2, 2025 |
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