Tuning a Mass Spectrometer Using Optimization
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United States of America Patent
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Jun 23, 2016
app pub date -
Dec 18, 2014
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Dec 18, 2014
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Systems, methods, and apparatuses are provided for tuning a mass spectrometer. An optimization process can be performed to determine optimal parameters for various physical parameters of elements of the mass spectrometer. A cost function (metric) can be defined for optimizing a measured signal output from the spectrometer. The metric can include an intensity term and a rectangularity term. The rectangularity term can provide a quantification of an extent that a measured signal corresponding to a first mass-to-charge ratio approximates a rectangle. The parameter values can be adjusted to find an optimal cost value of the cost function. Techniques may particularly useful when a quadrupole is operated in a broad-stability mode.
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