MICROGRID TROUBLESHOOTING METHOD

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United States of America Patent

APP PUB NO 20160179991A1
SERIAL NO

14572918

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Abstract

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A microgrid troubleshooting method entails, connecting a first trouble simulating unit between a utility electricity and an AC load, wherein an AC end of a second trouble simulating unit connects with the AC load, and a DC end of the second trouble simulating unit connects with a solar power generating unit, an energy-storing unit, a fuel cell unit, and a DC load; switching the second trouble simulating unit to a short-circuit state, measuring a microgrid earth potential rise, short-circuit current of the solar power generating unit, and short-circuit current of the energy-storing unit, and checking whether the microgrid is damaged; and switching the first trouble simulating unit to a short-circuit state, measuring a microgrid earth potential rise, and checking whether the microgrid is damaged. The method is effective in simulating troubles with the microgrid, measuring the microgrid's short-circuit current, and testing whether the microgrid's protection mechanism is functioning well.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGYNO 481 CHIA AN SEC CHUNG CHENG RD LONGTAN DIST TAOYUAN CITY 325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHEN, SHI-LIN LONGTAN TOWNSHIP, TW 6 37
HUANG, CHEN-HO LONGTAN TOWNSHIP, TW 2 2
JEN, KUO-KUANG LONGTAN TOWNSHIP, TW 56 187
LIEN, KENG-YU LONGTAN TOWNSHIP, TW 1 0

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