Dual-source security inspection CT scanning system and scanning method
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United States of America Patent
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Jun 23, 2016
app pub date -
Dec 23, 2015
filing date -
Dec 23, 2014
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Abstract
The present disclosure provides a dual-source security inspection CT scanning system and scanning method. The system includes two sets of scan imaging systems, wherein each set of the scan imaging systems has its own separate ray source and detector, the two sets of scan imaging systems are juxtaposed on a same rotary mechanism, and a predetermined interval is provided between imaging planes of the two sets of scan imaging systems. The present disclosure ensures the two sets of imaging optical paths do not interfere with each other, therefore effectively avoiding the problem of scattering mutual interference between the dual sources of the dual-source CT scanning system in the prior art.
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