FAULT DETECTION FOR A FLEXIBLE PROBE TIP
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United States of America Patent
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Dec 22, 2014
filing date -
Dec 22, 2014
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Abstract
A fault detection circuit for a flexible probe tip includes one or more conductive fault detection traces on a flexible substrate which are connected to a fault detector capable of determining if an electrical discontinuity or defect is present in the fault detection traces. The fault detector may also include a fault indicator, such as a light, to indicate to a user that it has detected a discontinuity and therefore that flexible probe tip should not be soldered onto the user's device under test. The fault detector may determine that there is a discontinuity in the fault detection traces by checking if the impedance of the fault detection trace changes, or by checking for a drop in voltage from one end of the fault detection trace to the other end, or by using other methods.
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