TEST STRIP AND METHOD TO DETERMINE TEST STRIP COMPATIBILITY
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United States of America Patent
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Issued Date -
Jun 23, 2016
app pub date -
Dec 17, 2014
filing date -
Dec 17, 2014
priority date (Note) -
Abandoned
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Abstract
An analyte measurement system is disclosed herein. The analyte measurement system includes a test strip. The test strip includes at least two electrodes spaced apart in a reaction chamber, one of said electrodes including a conductive material having a coating applied thereupon. The analyte measurement system also includes an analyte measurement device. The analyte measurement device includes a strip port having connectors configured to coupled to the electrodes of the test strip. The applied coating enables a capacitance value of the test strip to be measured in order to determine compatibility of the test strip with the analyte measurement device.
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