Parameter control method for integrated circuit and integrated circuit using the same
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United States of America Patent
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Nov 8, 2016
Grant Date -
Jun 2, 2016
app pub date -
May 18, 2015
filing date -
Nov 27, 2014
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Abstract
A parameter control method for an integrated circuit and an integrated circuit using the same are provided. The method includes the steps of: providing a correspondence between 1st to Nth impedance groups and 1st to Nth first settings, wherein each impedance group includes K sub impedances; providing a correspondence between 1st to Kth sub-impedance and 1st to Kth second settings; detecting an impedance from a specific pin of the integrated circuit; comparing an impedance detected from the specific pin of the integrated circuit with the 1st to Nth impedance sets to find a corresponding specific impedance set to select a specific first setting; comparing the impedance detected from the specific pin of the integrated circuit with the 1st to Kth sub-impedance of the specific impedance set to select a specific second setting; and operating the integrated circuit according to the specific first setting and the specific second setting.
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