Waveguide technique for the simultaneous measurement of temperature dependent properties of materials

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United States of America Patent

PATENT NO 10794870
APP PUB NO 20160153938A1
SERIAL NO

14903002

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Abstract

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A method and a system is provided for measuring mechanical properties of a solid material using standard ultrasonic wave modes propagated in the solid material, which forms a waveguide, where the waveguide is encased a fluid media. The method and system can be at high temperatures. The system includes an ultrasonic transducer placed at one end of the waveguide that generates multiple wave modes, which travel in different paths along a length of the waveguide and are reflected. The system includes a set of corresponding sensors for detecting the amplitude and time of flights, and includes a processor means to analyze the detected signals.

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Patent Owner(s)

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INDIAN INSTITUTE OF TECHNOLOGY MADRASTHE DEAN INDUSTRIAL CONSUL TANCY & SPONSORED RES IIT PO CHENNAI 600036

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  • 2014 Application Filing Year
  • G01N Class
  • 10055 Applications Filed
  • 7887 Patents Issued To-Date
  • 78.44 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2014201520162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Balasubramaniam, Krishnan Chennai, IN 8 34
Suresh, Periyannan Chennai, IN 1 133

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  • 2 Citation Count
  • G01N Class
  • 57.64 % this patent is cited more than
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