Epitaxial Structure and Growth Method of Group-III Nitrides

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United States of America Patent

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15016261

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Abstract

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A Group-III nitrides epitaxial structure includes a Si substrate, and a Group-III nitrides layer disposed over the Si substrate, wherein an interface structure of “coexistence of Al atoms and SixNy” between the Si substrate and the Group-III nitrides. Al atoms are configured to be absorbed to the Si substrate and connect the Group-III nitrides; and SixNy are configured to release mismatch stress caused by heteroepitaxy. A fabricating method comprises: (1) providing a Si substrate; (2) forming an interface structure over a surface of the Si substrate , wherein the interface structure is arranged with both Al atoms and SixNy, which are then cladded by an AlN epitaxial layer; and (3) growing Group-III nitrides over the interface structure wherein the Al atoms are configured to be absorbed to the Si substrate and connect the Group-III nitrides and the SixNy is configured to release mismatch stress generated by heteroepitaxy.

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Patent OwnerAddress
XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO LTD241000 ANHUI CITY OF WUHU PROVINCE ECONOMIC AND TECHNOLOGICAL DEVELOPMENT ZONE DONG LIANG ROAD NO 8 WUHU CITY ANHUI PROVINCE 241000

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHAO, CHIH-WEI Xiamen, CN 102 662
DU, YANHAO Xiamen, CN 2 0
HSU, CHEN-KE Xiamen, CN 108 284
LIN, WENYU Xiamen, CN 3 0
LIU, JIANMING Xiamen, CN 46 92
YANG, JEN-CHUN Xiamen, CN 1 0
YE, YI-SHIN Xiamen, CN 1 0
YEH, MENG-HSIN Xiamen, CN 12 35

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