METHODS AND SYSTEMS FOR STRUCTURAL ANALYSIS

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United States of America Patent

SERIAL NO

14734336

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Abstract

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The present disclosure provides systems and methods for analyzing a structure. A method for analyzing a structure comprises capturing a at least one set of images of the structure in at least one range of wavelengths of light with an image capture device mounted on a vehicle. The at least one set of images can be processed to provided at least one set of image data. The at least one set of image data can be combined with separate data to form a combined data set. The combined set of data can be analyzed to determine one or more properties of the structure.

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Patent Owner(s)

Patent OwnerAddress
ESSESS INC51 MELCHER STREET 7TH FLOOR BOSTON MA 02210

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jesneck, Jonathan Enfield, US 2 145
Phan, Long Somerville, US 18 310
Singh, Navrooppal Mullica Hill, US 2 145

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