Probe and contact inspection device
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United States of America Patent
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Jul 17, 2018
Grant Date -
May 26, 2016
app pub date -
Nov 19, 2015
filing date -
Nov 26, 2014
priority date (Note) -
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status (Latency Note)
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Abstract
A probe comprises a first end that contacts and separates from a test object and a second end that contacts a circuit board to perform inspection of the test object. The second end is provided with a rotation restricted portion that restricts rotation of the probe about the axial direction thereof. An extendable portion, which is freely extendable and contractible in the axial direction of the probe and has at least one spiral slit, is provided between the first end and the second end. The second end is formed by a tubular member. Also, at least two of the extendable portions are provided between the first end and the second end, and an intermediate portion is formed between the extendable portions.
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