ELECTRICALLY CONDUCTIVE SAMPLE BLOCKS FOR SCANNING ELECTRON MICROSCOPY
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United States of America Patent
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May 5, 2016
app pub date -
Jun 12, 2014
filing date -
Jun 14, 2013
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Abstract
The present invention provides a method for preparing a sample for microscopy, said method comprising the steps of contacting said sample with a first polymerizable resin under conditions and for a time sufficient for penetration of said first polymerizable resin into the sample, removing excessive first polymerizable resin from the surface of the sample, contacting the so-prepared sample containing said first polymerizable resin with a second polymerizable resin preparation, said second polymerizable resin preparation comprising a high concentration of electrically conductive particles, and subjecting the so-prepared sample to the curing temperature of the polymerizable resins, wherein the curing temperature of said second polymerizable resin preparation is substantially the same as the curing temperature of the first polymerizable resin.
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