METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

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United States of America Patent

APP PUB NO 20160111295A1
SERIAL NO

14566721

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Abstract

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A method for fabricating a semiconductor device is provided. The method includes the following steps. A substrate including a memory cell region and a peripheral region is provided, and a plurality of isolation structures are formed in the substrate. Each of the isolation structures contains an exposed portion protruding beyond the surface of the substrate. A first dielectric layer is formed on the substrate. A protective layer is formed on a sidewall of the exposed portion of each of the isolation structures. The first dielectric layer on the peripheral region is removed. A second dielectric layer is formed on the substrate of the peripheral region.

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Patent Owner(s)

Patent OwnerAddress
POWERCHIP TECHNOLOGY CORPORATIONNO 12 LI-HSIN RD I SCIENCE-BASED INDUSTRIAL PARK HSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Po-Cheng Hsinchu County, TW 11 20
Shih, Kai-Yao Hsinchu City, TW 7 3
Tai, Hsin Hsinchu City, TW 9 176
Wang, Ssu-Ting Taichung City, TW 4 5
Yin, Te-Yuan Hsinchu City, TW 4 5

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