Method and Apparatus of Tuning a Scanning Probe Microscope
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United States of America Patent
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Issued Date -
Apr 21, 2016
app pub date -
Aug 24, 2015
filing date -
Nov 11, 2011
priority date (Note) -
Abandoned
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Abstract
An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.
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