PROBES, STYLI, SYSTEMS INCORPORATING SAME AND METHODS OF MANUFACTURE
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United States of America Patent
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Issued Date -
Apr 7, 2016
app pub date -
Oct 6, 2015
filing date -
Oct 6, 2015
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
A probe for use with measuring equipment, such as a coordinate measuring machine (CMM) or a profilometer includes a shaft and a probe tip coupled with the shaft. At least a portion of the probe tip comprises a superabrasive material such as polycrystalline diamond. The probe tip may exhibit a variety of different geometries including, for example, substantially spherical, substantially cylindrical with a high aspect (length to diameter) ratio, or substantially disc-shaped. In other embodiments, the tip may include a converging portion leading to a fine-radiussed end point. The tip may be manufactured by forming a body using a high-pressure, high-temperature (HPHT) process and the shaping the body using a process such as electrical discharge machining (EDM), grinding or laser cutting.
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Patent Citation Ranking
- 4 Citation Count
- G01B Class
- 10.13 % this patent is cited more than
- 9 Age