3D Test Chart, Adjusting Arrangement, Forming Method and Adjusting Method Thereof
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United States of America Patent
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Issued Date -
Mar 31, 2016
app pub date -
Sep 30, 2015
filing date -
Sep 30, 2014
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Abstract
A 3D test chart, an adjusting arrangement, a forming method, and an adjusting method thereof are disclosed. The 3D test chart provides a plurality of test patterns arranged at different depths. When testing a photographic arrangement, the photographic arrangement is only required to move for one time or even does not need to be moved, so as to obtain an image containing information of different depths, so that the testing and adjusting process of the photographic arrangement can be easily achieved.
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