Method and Device for Estimating Quality Factor Based on Zero Offset Vertical Seismic Profile Data

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United States of America Patent

SERIAL NO

14919053

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This disclosure provides a method and a device for estimating a quality factor based on zero offset VSP (Vertical Seismic Profiling) data, wherein the method includes the following steps: determining a transmission coefficient between two adjacent VSP channels based on an interval velocity of a seismic wave in the zero offset VSP data; and determining the transmission coefficient as an indeterminate coefficient in an objective function of an index method, and estimating the quality factor according to the objective function of the index method.

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PETROCHINA COMPANY LIMITED100007 NO 9 NORTH MAIN STREET DONGCHENG DISTRICT BEIJING DONGZHIMEN BEIJING CITY BEIJING CITY 100007

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cui, Xingfu Beijing, CN 1 8
Hou, Lianhua Beijing, CN 12 23
Sun, Xiping Beijing, CN 1 8
Yu, Yongcai Beijing, CN 1 8
Zhang, Ming Beijing, CN 891 7236

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