CMP POLISHING SOLUTION AND POLISHING METHOD USING SAME

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United States of America Patent

APP PUB NO 20160086819A1
SERIAL NO

14786911

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Abstract

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A CMP polishing liquid for polishing a ruthenium-based metal, comprising polishing particles, an acid component, an oxidizing agent, and water, wherein the acid component contains at least one selected from the group consisting of inorganic acids, monocarboxylic acids, carboxylic acids having a plurality of carboxyl groups and having no hydroxyl group, and salts thereof, the polishing particles have a negative zeta potential in the CMP polishing liquid, and the pH of the CMP polishing liquid is less than 7.0.

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Patent Owner(s)

Patent OwnerAddress
HITACHI CHEMICAL COMPANY LTDCHIYODA-KU TOKYO 100-6606

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HANANO, Masayuki Chiyoda-ku, Tokyo, JP 14 97
MISHIMA, Kouji Chiyoda-ku, Tokyo, JP 8 59
SAKASHITA, Masahiro Chiyoda-ku, Tokyo, JP 13 248

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