Quantitative analysis of signal related measurements for trending and pattern recognition
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United States of America Patent
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Jan 26, 2021
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Mar 24, 2016
app pub date -
Apr 17, 2014
filing date -
May 6, 2013
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Abstract
A computerized method for quantitative analysis of signal related measurements, performed with one or more processors, is disclosed. An estimated signature typifying a characteristic feature of the signal related measurements is produced. Multidimensional statistics on the signal related measurements are computed in a multidimensional space with respect to the estimated signature. Matching likelihoods of the signal related measurements are quantified based on distances of the signal related measurements with respect to a shell manifold derived from the multidimensional statistics and enveloping a signature manifold in the multidimensional space. Multidimensional statistics on the estimated signature and trending and pattern recognition are also possible from the signal multidimensional projection.
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