FORCE SENSOR BASELINE CALIBRATION

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United States of America Patent

SERIAL NO

14864410

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Systems, methods, and apparatus for force sensor baseline calibration are disclosed herein. 1. Apparatus may include a force sensor configured to receive a plurality of force signals from a plurality of force sensitive elements, where the plurality of force signals is associated with a first touch at a first location of a sensing surface. The apparatus may include a touch sensor configured to receive a touch signal associated with the first touch. The apparatus may include processing logic coupled to the force sensor and the touch sensor, the processing logic being configured to determine a magnitude of a first component force associated with the first touch based, at least in part, on the plurality of force signals and the touch signal. The first component force may characterize a force applied by the first touch at the first location of the sensing surface.

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Patent Owner(s)

Patent OwnerAddress
MONTEREY RESEARCH LLC3945 FREEDOM CIRCLE SUITE 900 SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hutnyk, Volodymyr Ivana Frankivsk, UA 10 413
Karpin, Oleksandr Lviv, UA 51 699
Pirogov, Oleksandr Lviv, UA 22 812

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