Tungsten Film Forming Method

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United States of America Patent

APP PUB NO 20160040287A1
SERIAL NO

14819867

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Abstract

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A tungsten film forming method includes forming a tungsten film on a surface of a substrate to be processed by sequentially supplying a WCl6 gas as a tungsten source gas, a reducing gas composed of a reducible gas including hydrogen and a purge gas into a chamber which accommodates the substrate and which remains in a depressurized atmosphere. A Cl2 gas is simultaneously supplied when supplying the WCl6 gas.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
AIBA, Yasushi Nirasaki City, JP 14 196
AKASAKA, Yasushi Nirasaki City, JP 43 1471
HOTTA, Takanobu Nirasaki City, JP 24 473

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