SEMICONDUCTOR DEVICE

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United States of America Patent

SERIAL NO

14884615

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Abstract

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A semiconductor device according to this invention includes a support film that supports a lower electrode of a capacitor at an upper portion, and the support film includes a first insulating material having a stress within a range of +700 MPa to −700 MPa. Use of such a support film prevents a phenomenon in which the capacitor lower electrode is twisted. Preferably, the support film has a rate etched by hydrofluoric acid of 1.0 nm/sec or less and more preferably, the support film includes a silicon carbon nitride film.

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Patent Owner(s)

Patent OwnerAddress
LONGITUDE SEMICONDUCTOR S A R L208 VAL DES BONS MALADES LUXEMBOURG L-2121

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
MATSUI, Takayuki Tokyo, JP 86 809
SUKEKAWA, Mitsunari Tokyo, JP 62 672

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