Multi-reflecting mass spectrometer

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United States of America Patent

PATENT NO 9865445
SERIAL NO

14776613

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Abstract

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To improve spatial and energy acceptance of multi-reflecting time-of-flight, open traps, and electrostatic trap analyzers, a novel ion mirror is disclosed. Incorporation of immersion lens between ion mirrors allows reaching the fifth order time per energy focusing simultaneously with the third order time per spatial focusing including energy-spatial cross terms. Preferably the analyzer has hollow cylindrical geometry for extended flight path. The time-of-flight analyzer preferably incorporates spatially modulated ion mirror field for isochronous ion focusing in the tangential direction.

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Patent Owner(s)

Patent OwnerAddress
LECO CORPORATION3000 LAKEVIEW AVENUE ST JOSEPH MI 49085

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Verenchikov, Anatoly N St. Petersburg, RU 42 792
Yavor, Mikhail I St. Petersburg, RU 5 153

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