SEMICONDUCTOR RADIATION DETECTOR ARRAY

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United States of America Patent

APP PUB NO 20160033658A1
SERIAL NO

14525773

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A radiation detector with improved performance includes a probe and a first detector element constructed from planar semiconductor material in the probe. The detector further includes a second detector element constructed from planar semiconductor material in the probe. The detector further includes a focal point located outside of the probe. The detector further includes a circuit in communication with the detector elements. The first and second detector elements face the focal point and have the same solid angle relative to the focal point. The detector elements generate signals in response to incident radiation. The circuit receives the signals generated by the detector elements.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH SCIENCE CORPORATIONTOKYO
HITACHI HIGH-TECHNOLOGIES SCIENCE AMERICA INC19865 NORDHOFF STREET NORTHRIDGE CA 91324

International Classification(s)

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  • 2014 Application Filing Year
  • H01L Class
  • 23828 Applications Filed
  • 21803 Patents Issued To-Date
  • 91.51 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2014201520162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Barkan, Shaul Stevenson Ranch, US 2 11
Brilliante, Gapasin Saugus, US 1 2
Damron, Elena Palmdale, US 1 2
Saveliev, Valeri Palmdale, US 4 138
Wang, Yen-Nai Los Angeles, US 1 2

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Patent Citation Ranking

  • 2 Citation Count
  • H01L Class
  • 13.47 % this patent is cited more than
  • 9 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges1792827316886303131891006776342711301 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +050010001500200025003000350040004500500055006000650070007500800085009000

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