Methods and Apparatus for Data Analysis
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United States of America Patent
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Jan 28, 2016
app pub date -
Sep 16, 2015
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Dec 7, 2003
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to test a set of components and generate test data for the components. A diagnostic system automatically analyzes the test data to identify a characteristic of a component fabrication process by recognizing a pattern in the test data and classifying the pattern using a neural network.
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