Inspection systems with two X-ray scanners in a first stage inspection system
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United States of America Patent
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Mar 13, 2018
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app pub date -
Apr 10, 2015
filing date -
Aug 8, 2003
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Abstract
This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and/or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection.
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