SAMPLE HOLDER FOR THE EXAMINATION OF SMALL SAMPLES CONTAINED IN A SUSPENSION
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app pub date -
Jun 30, 2015
filing date -
Jul 2, 2014
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Abandoned
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Abstract
A sample holder for the examination of small particles contained in a suspension using X-rays or electron beams is depicted and described, wherein the sample holder includes a single-crystal substrate extending in a plane, the dimensions of which in the plane are several times larger than the dimensions perpendicular to the plane, wherein the substrate includes a first and a second surface, which run parallel to the plane, and wherein the substrate includes through-holes, which extend perpendicular to the plane and which run from the first to the second surface.
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