SEMICONDUCTOR DEVICE
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United States of America Patent
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app pub date -
Sep 11, 2015
filing date -
Oct 21, 2011
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Abstract
The disclosed invention provides a semiconductor device that enables early discovery of a sign of aged deterioration that occurs locally. An LSI has a plurality of modules and a delay monitor cluster including a plurality of delay monitors. Each delay monitor inducts a ring oscillator having a plurality of gate elements. Each delay monitor measures a delay time of the gate elements. A CPU #0 determines if a module proximate to a delay monitor suffers from aged deterioration, based on the delay time measured by the delay monitor.
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