TRANSISTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

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United States of America Patent

APP PUB NO 20150380552A1
SERIAL NO

14315821

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Abstract

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A transistor structure is provided to reduce the sizes of a semiconductor device applying the transistor structure and maximize the performance of the semiconductor device, wherein the transistor structure comprises a substrate, a first semiconductor layer, a second semiconductor layer and a first gate structure. The first semiconductor layer that is formed on the substrate has a first space by which the first semiconductor layer is divided into a first region and a second region. The second semiconductor layer that is formed on the substrate and stacked on the first semiconductor layer comprises a first source region stacked on the first region, a first drain region stacked on the second region, a first floating structure crossing the first space and connected between the first source region and the first drain region. The first gate structure surrounds the first floating structure.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL APPLIED RESEARCH LABORATORIES3F NO 106 HO-PING E RD SEC 2 TAIPEI CITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
LIU, Chee-Wee Taipei, TW 142 1392
TU, Wen-Hsien New Taipei, TW 15 12

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