PLASMONIC PROJECTED DIFFRACTION SENSOR
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United States of America Patent
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Issued Date -
Dec 31, 2015
app pub date -
Dec 3, 2013
filing date -
Feb 8, 2013
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Abstract
A device for detecting an analyte includes a light source emitting substantially monochromatic light; a two-dimensional diffraction element that interacts with the light from the light source, the diffraction element having one or more features that can generate plasmon waves upon receipt of the light from the light source, at least some of the features being configured to interact with the analyte; and a two-dimensional image sensor facing the diffraction element to receive diffracted light from the diffraction element so as to detect a diffraction pattern projected thereto and to measure a two-dimensional spatial change in the diffraction pattern that occurs as a result of the analyte interacting with the feature of the diffraction element.
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