System for generating a test pattern to detect and isolate stuck faults for an interface using transition coding
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United States of America Patent
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Dec 26, 2017
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Jun 22, 2015
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Jun 20, 2014
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Abstract
Conventional methods using signal test patterns to identify wiring errors are difficult to apply to interfaces encoding information as signal state transitions rather than directly as signal states. A system utilizing excitation of wires with selected transition coded patterns and evaluation of received results is described to identify failed wire connections. This approach may be advantageously used to provide fault detection and redundant path selection in systems incorporating stacked chip interconnections using Through Silicon Vias.
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