Image mask film scheme and method

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United States of America Patent

PATENT NO 9581894
SERIAL NO

14841141

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A system and method for repairing a photolithographic mask is provided. An embodiment comprises forming a shielding layer over an absorbance layer on a substrate. Once the shielding layer is in place, the absorbance layer may be repaired using, e.g., an e-beam process to initiate a reaction to repair a defect in the absorbance layer, with the shielding layer being used to shield the remainder of the absorbance layer from undesirable etching during the repair process.

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Patent Owner(s)

  • TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Jong-Yuh Jhubei, TW 27 64
Chen, Chun-Lang Madou Township, TW 55 312
Hsu, Boming Tainan, TW 9 114
Shen, Tran-Hui Dounan Township, TW 19 116
Tu, Chih-Chiang Tauyen, TW 85 480

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