DYNAMIC LIGHT SCATTERING MEASUREMENT DEVICE AND DYNAMIC LIGHT SCATTERING MEASUREMENT METHOD
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United States of America Patent
Stats
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N/A
Issued Date -
Dec 24, 2015
app pub date -
Jun 18, 2015
filing date -
Jun 20, 2014
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A dynamic light scattering measurement device includes an irradiation section that applies light emitted from a low-coherence light source to a sample that includes particles, a spectral intensity acquisition section that disperses reflected light from a reference plane and scattered light from the sample that has passed through the reference plane to acquire a spectral intensity of interference light of the reflected light and the scattered light, the reference plane being situated to intersect an optical path through which the light is applied to the sample, and a measurement section that measures dynamic light scattering of the sample based on the acquired spectral intensity.
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Family
| Country | kind | publication No. | Filing Date |
|---|---|---|---|
| JP | B2 | JP6348349 | Jun 20, 2014 |
| TW | A | TW201614217 | Jun 16, 2015 |
| KR | A | KR20150146415 | Jun 17, 2015 |
| CN | A | CN105277490 | Jun 18, 2015 |
| EP | A1 | EP2960635 | Jun 19, 2015 |
International Classification(s)
- 2015 Application Filing Year
- G01N Class
- 11310 Applications Filed
- 8345 Patents Issued To-Date
- 73.79 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 3 Citation Count
- G01N Class
- 23.45 % this patent is cited more than
- 10 Age