SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

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United States of America Patent

APP PUB NO 20150348871A1
SERIAL NO

14289664

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Abstract

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A semiconductor device includes a substrate having a first side and a second side opposite to the first side; a through substrate via (TSV) structure protruding from a surface of the substrate on the second side; a block layer conformally covering the surface of the substrate and the TSV structure; a first dielectric layer covering the block layer except for a portion of the block layer that is directly on the TSV structure; a second dielectric layer on the first dielectric layer; and a damascened circuit pattern in the second dielectric layer. The second dielectric layer is in direct contact with the first dielectric layer. The damascened circuit pattern is in direct contact with the TSV structure.

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Patent Owner(s)

Patent OwnerAddress
INOTERA MEMORIES INCNO 667 FUHSING 3RD RD HWA-YA TECHNOLOGY PARK GUISHAN DIST TAOYUAN CITY 333

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chiang, Hsu New Taipei City, TW 27 90
Hu, Yaw-Wen Taoyuan County, TW 22 52
Lee, Tzung-Han Taipei City, TW 135 609
Shih, Neng-Tai New Taipei City, TW 37 240

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