MULTILAYER THIN FILM FOR CUTTING TOOL AND CUTTING TOOL INCLUDING THE SAME
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United States of America Patent
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Nov 26, 2015
app pub date -
May 21, 2013
filing date -
Dec 27, 2012
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Abstract
Provided is a multilayer thin film for a cutting tool, in which unit thin films each of which is formed of a total of four thin layers are stacked more than once, the multilayer thin film being capable of realizing improved physical properties compared with conventional one by adjusting an elastic period and a lattice period between the four thin layers. The multilayer thin film for a cutting tool according to the present disclosure is a multilayer thin film for a cutting tool, in which unit thin films each of which is sequentially stacked with thin layers A, B, C, and D are stacked more than once, wherein elastic modulus k between the thin layers satisfies relationships of kA, kC>kB, kD or kB, kD>kC, kA, and lattice parameter L between the thin layers satisfies relationships of LA>LB, LD>LC or LC>LB, LD>LA.
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