A HIGH ELECTRON MOBILITY DEVICE BASED ON THE GATE-FIRST PROCESS AND THE PRODUCTION METHOD THEREOF

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United States of America Patent

APP PUB NO 20150333141A1
SERIAL NO

14651984

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Abstract

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The present disclosure belongs to the technical field of radio frequency power devices, and more specifically, to a high electron mobility device based on the gate-first process and the production method thereof. The high electro mobility device is made by adopting the gate-first process according to the present disclosure, wherein gate dielectric sidewalls are utilized to implement the self-alignment of the gate and source; besides, the source and drain of the device can be formed directly by use of the alloying process, the iron implanting process or epitaxy process after formation of the gate since the gate is protected by the passivating layer, featuring a simple technological process while reducing parameter shift of products and enhancing the electrical properties of high electron mobility devices.

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Patent Owner(s)

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FUDAN UNIVERSITYSHANGHAI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Liu, Xiaoyong Shanghai, CN 111 562
Sun, Qingqing Shanghai, CN 42 238
Wang, Pengfei Shanghai, CN 172 398
Zhang, Wei Shanghai, CN 2625 19909
Zhou, Peng Shanghai, CN 284 6195

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