METHOD OF PROCESSING WAFER

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United States of America Patent

APP PUB NO 20150332911A1
SERIAL NO

14713690

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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A wafer has a device region on a front surface where a plurality of devices are disposed and an outer circumferential excess region surrounding the device region. The wafer has a chamfered portion of arcuate cross section on an outer circumferential edge thereof, the chamfered portion extending from the front surface to a reverse side of the wafer. A sheet having an adhering capability and tack strength with respect to the wafer is applied to the front surface of the wafer with an adhesive placed on the outer circumferential excess region. Then a cutting blade cuts into the chamfered portion by a predetermined depth from the front surface of the wafer, and the wafer is cut along the outer circumferential edge thereof to remove part of the chamfered portion and keep part of the adhesive adjacent to at least the device region unremoved.

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Patent Owner(s)

Patent OwnerAddress
DISCO CORPORATION13-11 OMORI-KITA 2-CHOME OTA-KU TOKYO 143-8580

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Priewasser, Karl Heinz Muenchen, DE 50 196

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