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United States of America Patent
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Issued Date -
Nov 19, 2015
app pub date -
Sep 24, 2014
filing date -
Sep 30, 2013
priority date (Note) -
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Abstract
An analysis system for analyzing circuits and other appropriate devices as well as its method of use are disclosed. In one embodiment, a system may include one or more electromagnetic field generators configured to generate an electromagnetic field proximate to a circuit. The system may also include one or more electromagnetic field sensors configured to scan the circuit by detecting an electromagnetic field induced in the circuit. An associated computing device may be configured to receive the scan of the circuit and compare the scan to a reference scan of the circuit to determine whether the circuit is different from the reference scan.
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