MAGNETIC PROFILE MEASURING DEVICE AND METHOD FOR MEASURING MAGNETIC PROFILE FOR DIRECT-CURRENT (DC) MAGNETIC FIELD
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Nov 12, 2015
app pub date -
Sep 25, 2012
filing date -
Sep 26, 2011
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
A magnetic profile measuring device which scans on a surface of a specimen by a magnetized probe on a tip of a driven cantilever, detects vibration of the cantilever, and generates a magnetic field distribution image of the area, the device including: the cantilever having the probe equipped on tip thereof; a driver driving the cantilever; an alternating-current magnetic field generator periodically reversing the magnetic polarity of the probe; a vibration sensor detecting vibration of the probe; a demodulator demodulating from a detection signal of the vibration sensor a magnetic signal corresponding to an alternating magnetic force between the probe and the specimen; a scanning mechanism; a data storage storing an initial data for each coordinate of the scanning area; a modified data generator generating a plurality of data by modifying the phase of the initial data; and an image display device.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully