DEBUGGING SYSTEM AND METHOD
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United States of America Patent
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Issued Date -
Nov 5, 2015
app pub date -
May 1, 2015
filing date -
May 2, 2014
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Abstract
A method, computer program product, and computing system for defining a first group of transient values for a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform. A monitoring subsystem is electrically coupled to the first group of conductive paths. A first group of signals present on the first group of conductive paths is monitored while executing at least a portion of an automated test process on the automated test platform to determine if any of the first group of signals exceeds any of the first group of transient values.
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