MICROBOLOMETER CONTACT SYSTEMS AND METHODS

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United States of America Patent

SERIAL NO

14281780

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Abstract

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Systems and methods are directed to contacts for an infrared detector. For example, an infrared imaging device includes a substrate having a first metal layer and an infrared detector array coupled to the substrate via a plurality of contacts. Each contact includes for an embodiment a second metal layer formed on the first metal layer; a third metal layer formed on the second metal layer, wherein the third metal layer at least partially fills an inner portion of the contact; and a first passivation layer formed on the third metal layer.

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Patent Owner(s)

Patent OwnerAddress
FLIR SYSTEMS INC27700A SW PARKWAY AVENUE WILSONVILLE OR 97070

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Franklin, Patrick Santa Barbara, US 9 26
Kurth, Eric A Santa Barbara, US 64 1206

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