PHOSPHOROUS-CONTAINING COPPER ANODE FOR ELECTROLYTIC COPPER PLATING, METHOD FOR MANUFACTURING SAME, AND ELECTROLYTIC COPPER PLATING METHOD
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United States of America Patent
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Issued Date -
Oct 29, 2015
app pub date -
Jan 7, 2011
filing date -
Jan 12, 2010
priority date (Note) -
Published
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Abstract
Provided are a phosphorous-containing copper anode for electrolytic copper plating, a method for manufacturing the same, and an electrolytic copper plating method using the phosphorous-containing copper anode. The phosphorous-containing copper anode obtains a crystal grain boundary structure having a special grain boundary ratio LσN/LN of 0.4 or more. LN is a unit total special grain boundary length corresponding to a unit area of 1 mm2 obtained by converting a total grain boundary length L. LσN is a unit total special boundary length corresponding to a unit area of 1 mm2 obtained by converting a total special grain boundary length Lσ. By having the configuration described above, a black film is formed evenly on the copper anode at the early stage of the electrolytic copper plating. Plating defect can be reduced by preventing the black film being fallen.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
MITSUBISHI MATERIALS CORPORATION | TOKYO |
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- [Classification Symbol]
- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Nakaya, Kiyotaka | Naka-gun, JP | 36 | 39 |
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