SENSITIVITY INSPECTION SYSTEM AND SENSITIVITY INSPECTION METHOD
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United States of America Patent
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Issued Date -
Oct 22, 2015
app pub date -
Mar 25, 2015
filing date -
Apr 16, 2014
priority date (Note) -
Abandoned
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Abstract
A sensitivity inspection system for inspecting the sensitivity of an electrostatic capacitance sensor, including an output acquisition unit acquiring first and second values that are respectively the first and second outputs of the electrostatic capacitance sensor that is in an inspection state and is made inclined, a first conversion unit obtaining a first ratio of a theoretical value of the first output when first reference acceleration is applied to a theoretical value of the first output when acceleration in the first direction is applied in the inspection state, and multiplying the acquired first value by the first ratio, and a second conversion unit obtaining a second ratio of a theoretical value of the second output when second reference acceleration is applied to a theoretical value of the second output when acceleration in the second direction is applied in the inspection state, and multiplying the acquired second value by the second ratio.
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