BACKLIGHT UNIT TESTING JIG, METHOD FOR SIMULATING STATE OF BACKLIGHT UNIT AND APPARATUS FOR TESTING RELIABILITY
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United States of America Patent
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Issued Date -
Oct 22, 2015
app pub date -
Aug 21, 2014
filing date -
Dec 31, 2013
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Abstract
A backlight unit testing jig, a method for simulating a state of a backlight unit and an apparatus for testing reliability are provided, the testing jig comprises a jig base (6) and four jig side frames (7, 8, 9), the four jig side frames (7, 8, 9) are provided on the jig base (6) and sequentially interconnected with each other to form a cavity structure. With this testing jig, it's possible to simulate a state of a material in a backlight unit, thus shorten the development cycle, reduce development risk, and thereby improve development efficiency.
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