UNIT TESTING OF DATA STORAGE DEVICES AT A DATA CENTER
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United States of America Patent
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Issued Date -
Oct 15, 2015
app pub date -
Apr 11, 2014
filing date -
Apr 11, 2014
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Abandoned
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Abstract
A plurality of data storage devices from a storage device provider are received, at a data center. A tester is received at the data center via the storage device provider. A unit test of the data storage devices is performed at the data center via the tester contemporaneously with using the data storage devices in the data center.
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