INSPECTION DEVICE AND INSPECTION METHOD

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United States of America Patent

APP PUB NO 20150293034A1
SERIAL NO

14440029

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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To provide a technique for improving a detection precision of the inspection device. The inspection device 100 includes an irradiation unit 101 that irradiates a beam by pulse oscillation onto a surface of the sample from a laser light source, a detection unit 102 on which light from the surface of the sample by the irradiation is made incident to generate and output a detection signal, and a detection control unit 104 that generates a gate signal (G) for controlling an input/output of the detection unit 102 in synchronization with a timing of the pulse oscillation of the irradiation unit 101, and applies the gate signal (G) to the detection unit 102. The detection unit 102 allows the light to be made incident thereon at a timing in accordance with the gate signal (G), and generates and outputs a detection signal.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECHNOLOGIES CORPORATION24-14 NISHI-SHIMBASHI 1-CHOME MINATO-KU TOKYO

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jingu, Takahiro Tokyo, JP 79 907
Makuuchi, Masami Tokyo, JP 38 331

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