CHEMICAL MECHANICAL POLISHING CONDITIONER CAPABLE OF CONTROLLING POLISHING DEPTH

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20150290768A1
SERIAL NO

14676953

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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Provided is a chemical mechanical polishing conditioner capable of controlling a polishing depth. The CMP conditioner capable of controlling the polishing depth comprises a substrate; a binding layer disposed on the substrate; multiple abrasive units placed on the binding layer; and multiple abrasive terminal units placed on the binding layer. Each abrasive unit has an abrasive unit substrate and an abrasive layer, and the abrasive layer is a diamond film formed by chemical vapor deposition and has multiple abrasive tips. The abrasive tips of the abrasive units are relatively higher than surfaces of the abrasive terminal units to form a protrusion height. Accordingly, the CMP conditioner controls the polishing depth of an article to be conditioned.

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Patent Owner(s)

Patent OwnerAddress
KINIK COMPANYNO 10 YENPING SOUTH RD TAIPEI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHENG, CHUNG-YI TAIPEI, TW 16 43
CHIU, CHIA-FENG NEW TAIPEI CITY, TW 23 165
CHOU, JUI-LIN NEW TAIPEI CITY, TW 30 191
WANG, CHIA-CHUN NEW TAIPEI CITY, TW 27 32

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